Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials. Founded at 2009


Fluorination of CVD graphene films by inductively coupled plasma CF4

E.P. Neustroev, I.I. Kurkina

North-Eastern Federal University named after M.K. Ammosov

DOI: 10.26456/pcascnn/2025.17.109

Original article

Abstract: Synthesis of nanometer-thick dielectric films is one of the key tasks in nano- and optoelectronics, which is associated with growing requirements for miniaturization and functionality of devices. This paper presents the results of a study of optical and electrical properties of graphene fluorinated by inductively coupled plasma CF4. Fluorination was carried out in plasma with a power of 125 to 200 W for duration of up to 1 min. Two methods of arranging samples in the plasma chamber were used: 1) with a graphene film facing plasma and 2) with a substrate facing plasma. The methods of Raman spectroscopy, X-ray energy-dispersive spectroscopy, and current-voltage characteristics were used in the study. It was shown that the direct plasma action on the samples in position 1 results in graphene etching until the film is completely removed. In position 2, no intensive etching is observed during treatments lasting up to 1 min. In this case, fluorination of the graphene film occurs. As a result, the ratio of the number of fluorine atoms to carbon reaches a value of ~0,2. As a result of plasma treatment, there is a significant increase in the electrical resistance of graphene. The increase in surface resistance was from several kΩ/sq for the initial graphene to hundreds of GΩ/sq and tens of MΩ/sq for the samples subjected to plasma action in positions 1 and 2, respectively. The increase in the electrical resistance may be due to both the appearance of defects during plasma treatment and the fluorination process, which forms sp3-hybridized C-F bonds that distort the flat structure of graphene. Repeated conductivity assessments carried out after three weeks showed a decrease in resistance by two orders of magnitude for samples treated in plasma in position 2. This decrease may be due to the processes of defluorination and restoration of the flat structure of graphene.

Keywords: graphene, chemical vapor deposition, fluorination, plasma, carbon tetrafluoride, electrical resistance

  • Efim P. Neustroev – Ph. D., Docent, Department of Radiophysics and Electronic Systems, North-Eastern Federal University named after M.K. Ammosov
  • Irina I. Kurkina – Ph. D., senior researcher, Institute of Physics and Technologies, North-Eastern Federal University named after M.K. Ammosov

For citation:

Neustroev E.P., Kurkina I.I. Ftorirovanie plenok CVD-grafena v induktivno svyazannoj plazme CF4 [Fluorination of CVD graphene films by inductively coupled plasma CF4], Fiziko-khimicheskie aspekty izucheniya klasterov, nanostruktur i nanomaterialov [Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials], 2025, issue 17, pp. 109-117. DOI: 10.26456/pcascnn/2025.17.109.

Full article (in Russian): download PDF file

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