Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials
Founded at 2009


The use of liquid probes based on an eutectic solution for studying the conducting properties of thin films

N.V. Permiakov

Saint Petersburg Electrotechnical University «LETI»

DOI: 10.26456/pcascnn/2021.13.338

Short communication

Abstract: The work is devoted to development of a modular four-probe setup using a liquid contact based on an indium-gallium eutectic solution ( EGaIn), which can be used to create clamping liquid contacts that do not introduce mechanical deformation into the measured structures. It is proposed to use this setup for measuring the current-voltage characteristics of thin-film samples. A modular measurement scheme is assumed. Each probe is driven by four motors to position and expel a drop from the syringe to form the desired contact area size. Optical control is used to prepare the probes and measure the diameter of the formed contact areas. The parameters for the manufacture of liquid probes are selected, namely, the speed of extrusion and movement of the probe along the vertical axis to form a conical droplet. The installation is controlled in the LabView environment.

Keywords: indium-gallium eutectic, electric probe, adjustable contact area size, thin films, current- voltage characteristic

  • Nikita V. Permiakov – Ph. D., Docent, Micro- and Nanoelectronics Department, Saint Petersburg Electrotechnical University «LETI»

Reference:

Permiakov, N.V. The use of liquid probes based on an eutectic solution for studying the conducting properties of thin films / N.V. Permiakov // Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials. – Tver: TSU, 2021. — I. 13. — P. 338-344. DOI: 10.26456/pcascnn/2021.13.338. (In Russian).

Full article (in Russian): download PDF file

References:

1. Moshnikov V.A., Spivak Yu.M., Alekseev P.A., Permiakov N.V. Atomno-silovaya mikroskopiya dlya issledovaniya nanostrukturirovannykh materialov i pribornykh struktur: uchebnoe posobie [Atomic force microscopy for the study of nanostructured materials and instrument structures]. Saint Petersburg, ETU «LETI» Publ., 2014, 144 p. (In Russian).
2. Borodzyulya V.F., Moshnikov V.A., Permiakov N.V. Izmeritel'nyj zond i sposob ego izgotovleniya [Measuring probe and method of its manufacture]. Patent RF, no 2017114837, 2017. (In Russian).
3. Antonov A.S., Ivanov D.V., Sorokina I.I., Sdobnyakov N.Yu. Sravnitel'noe issledovanie vol't-ampernykh kharakteristik tunnel'nogo kontakta nanorazmernykh plenok zolota i serebra [Comparative investigation of the current-voltage characteristics of tunelling contact for nanosized gold and silver films], Fiziko-khimicheskie aspekty izucheniya klasterov, nanostruktur i nanomaterialov [Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials], 2016, issue. 8, pp. 13-18. (In Russian).
4. Antonov A.S., Voronova E.A., Sdobnyakov N.Yu., Mikhailova O.V. Otsenka geometricheskikh kharakteristik nanopokrytiya khroma na stekle i izmerenie vol't-ampernykh kharakteristik [The evaluation of the geometrical characteristics of 3 – D images of the chrome nanocoating on the glass substrate and the measurement of the current-voltage characteristics], Nanotekhnika [Nanotechnology], 2014, no. 2 (38), pp. 8-10. (In Russian).
5. Antonov A.S., Sokolov D.N., Sdobnyakov N.Yu. et al. Modelirovanie protsessa vzaimodejstviya v sisteme zond STM – obrazets so slozhnym rel'efom: rekomendatsii po shtatnomu tekhnologicheskomu rezhimu raboty [Simulation of interaction process in the system STM probe – sample with a complex relief: recommendations on the standard technological mode], Fiziko-khimicheskie aspekty izucheniya klasterov, nanostruktur i nanomaterialov [Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials], 2017, issue 9, pp. 6-18. DOI: 10.26456/pcascnn/2017.9.006. (In Russian).
6. Sokolov D.N., Sdobnyakov N.Yu., Kutilin P.S. et al. O modelirovanii termicheskikh effektov pri vzaimodejstvii zonda skaniruyushchego tunnel'nogo mikroskopa s obraztsom [On the simulation of thermal effects in interaction between a probe tip of the scanning tunneling microscope and a sample], Nanotekhnika [Nanotechnology], 2013, no. 2 (34), pp. 78-80. (In Russian).
7. Rothemund P., Bowers C.M., Suo Z., Whitesides G.M. Influence of the contact area on the current density across molecular tunneling junctions measured with egain top-electrodes, Chemistry of Materials, 2018, vol. 30, issue 1, pp. 129-137. DOI: 10.1021/acs.chemmater.7b03384.
8. Rampi M.A., Whitesides G.M. A versatile experimental approach for understanding electron transport through organic materials, Chemical Physics, 2002, vol. 281, issue 2-3, pp. 373-391. DOI: 10.1016/S0301-0104(02)00445-7.
9. Chiechi R.C., Weiss E.A., Dickey M.D., Whitesides G.M. Eutectic gallium-indium ( EGaIn ): a moldable liquid metal for electrical characterization of self-assembled monolayers, Angewandte Chemie, 2008, vol. 120, issue 1, pp. 142-144. DOI: 10.1002/anie.200703642.
10. Fassler A., Majidi C. Soft-matter capacitors and inductors for hyperelastic strain sensing and stretchable electronics, Smart Materials and Structures, 2013, vol. 22, no. 5, art. no. 055230, 8 p. DOI: 10.1088/0964-1726/22/5/055023.
11. Tabatabai A., Fassler A., Usiak C., Majidi C. Liquid-phase gallium–indium alloy electronics with microcontact printing, Langmuir, 2013, vol. 29, issue 20, pp. 6194-6200. DOI: 10.1021/la401245d.
12. Drobnov A.P., Permiakov N.V., Moshnikov V.A. Avtomatizirovannaya termozondovaya ustanovka dlya otsenki otkloneniya ot stekhiometrii sobstvennykh elektricheski aktivnykh defektov (kontsentratsii nositelej zaryada) khal'kogenidov elementov IV gruppy [Automated thermal probe installation for assessing the deviation from stoichiometry of intrinsic electrically active defects (concentration of charge carriers) of chalcogenides of Group IV elements], Fundamental'nye problemy radioelektronnogo priborostroeniya [Fundamental problems of radioengineering and device construction], 2018, vol. 18, no. 3, pp. 758-761. (In Russian).
13. Semenyuk A.V., Permiakov N.V., Moshnikov V.A. Ustanovka s zhidkim tochechnym kontaktom dlya provedeniya elektricheskikh izmerenij [Installation with liquid point contact for electrical measurements], Fundamental'nye problemy radioelektronnogo priborostroeniya [Fundamental problems of radioengineering and device construction], 2018, vol. 18, no. 3, pp. 604-607. (In Russian).
14. Bobkov A.A., Borodzyulya V.F., Lamkin I.A. et al. Study of effects occurring on formation of fractal microstructures in layers of polycarbonate, polymethyl methacrylate, indium tin oxide, and zinc oxide, Glass Physics and Chemistry, 2018, vol. 44, issue 5, pp. 480-485. DOI: 10.1134/S1087659618050048.

⇐ Prevoius journal article | Content | Next journal article ⇒