Obtaining nanosized platinum films with fractal properties
D.V. Ivanov1, A.S. Antonov1,2, E.M. Semenova1, A.I. Ivanova1, S.A. Tretyakov1, N.Yu. Sdobnyakov1
1Tver State University, Tver, Russia
2Tver State Agricultural Academy, Tver, Russia
Abstract: A comprehensive study of the morphology of the relief of nanosized platinum films on the mica surface was carried out using a scanning probe (in the atomic force mode) and tunneling microscopes, as well as an optical interference profilometer. Сharacteristic features of the surface nanorelief of platinum films of various thicknesses, including fractal properties, are described. The values of the fractal dimension were obtained for films of different thicknesses using two alternative methods of investigation at different initial scales of samples: based on the data of an atomic force microscope – Dc = 2,28 ÷ 2,35 and a scanning tunneling microscope – Dc = 2,12 ÷ 2,26. For comparison, experimental data of other authors are presented. Recommendations for development of the technology for «growing» structures with a given surface morphology are proposed.
Keywords: scanning probe microscopy, atomic force microscope mode, scanning tunneling microscopy, nanorelief, roughness parameters, fractal dimension, platinum films.
Ivanov, D.V. Obtaining nanosized platinum films with fractal properties / D.V. Ivanov, A.S. Antonov, E.M. Semenova, A.I. Ivanova, S.A. Tretyakov, N.Yu. Sdobnyakov // Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials. – 2020. – I. 12. – P. 073-088. DOI: 10.26456/pcascnn/2020.12.073. (In Russian).
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