Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials. Founded at 2009

ON THE TECHNIQUE OF THE EVALUATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED LIQUID FILMS BY ELLIPSOMETRIC METHOD

N.Yu. Sdobnyakov, N.V. Novozhilov, A.S. Antonov, E.A. Voronova, O.V. Mikhailova

DOI: 10.26456/pcascnn/2015.7.444

Original article

Abstract: On the basis of the spectrum analysis of ellipsometric angles ψ and Δ , the technique of the evaluation of the thickness dependence of the refractive index for nanosized liquid films is outlined using the photometric spectroellipsometry.

Keywords: photometric spectroellipsometer, nanosized liquid films, refractive index, thickness dependence

  • N.Yu. Sdobnyakov
  • N.V. Novozhilov
  • A.S. Antonov
  • E.A. Voronova
  • O.V. Mikhailova

Reference:

Sdobnyakov N.Yu., Novozhilov N.V., Antonov A.S., Voronova E.A., Mikhailova O.V. O metodike otsenki zavisimosti pokazatelya prelomleniya ot tolshchiny nanorazmernoj plenki ellipsometricheskim metodom [ON THE TECHNIQUE OF THE EVALUATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED LIQUID FILMS BY ELLIPSOMETRIC METHOD], Fiziko-khimicheskie aspekty izucheniya klasterov, nanostruktur i nanomaterialov [Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials], 2015, issue 7, pp. 444-449. DOI: 10.26456/pcascnn/2015.7.444. ⎘

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