Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials
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ON THE TECHNIQUE OF THE EVALUATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED LIQUID FILMS BY ELLIPSOMETRIC METHOD

N.Yu. Sdobnyakov, N.V. Novozhilov, A.S. Antonov, E.A. Voronova, O.V. Mikhailova

DOI: 10.26456/pcascnn/2015.7.444

Original article

Abstract: On the basis of the spectrum analysis of ellipsometric angles ψ and Δ , the technique of the evaluation of the thickness dependence of the refractive index for nanosized liquid films is outlined using the photometric spectroellipsometry.

Keywords: photometric spectroellipsometer, nanosized liquid films, refractive index, thickness dependence

  • N.Yu. Sdobnyakov
  • N.V. Novozhilov
  • A.S. Antonov
  • E.A. Voronova
  • O.V. Mikhailova

Reference:

Sdobnyakov, N.Yu. ON THE TECHNIQUE OF THE EVALUATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED LIQUID FILMS BY ELLIPSOMETRIC METHOD / N.Yu. Sdobnyakov, N.V. Novozhilov, A.S. Antonov, E.A. Voronova, O.V. Mikhailova // Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials. — 2015. — I. 7. — P. 444-449. DOI: 10.26456/pcascnn/2015.7.444. (In Russian).

Full article (in Russian): download PDF file

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