Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials
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SCANNING TUNNELING MICROSCOPY FOR THE NANOCOATING «SILVER/MICA»: RELIEF MORPHOLOGY AND ELECTRICAL CHARACTERISTICS

A.S. Antonov, O.V. Mikhailova (Zonova), N.Yu. Sdobnyakov, D.N. Sokolov, D.V. Ivanov

DOI: 10.26456/pcascnn/2015.7.031

Original article

Abstract: As a result of our investigation, it was shown that of thin metal films on dielectric substrates allow to prepare samples that satisfy the requirements for working the scanning probe microscope in scanning tunneling microscope mode. This preserves the information about the features of the surface morphology of individual objects smaller than 100 nm. The sample «silver/mica» is considered as an example. Linear dimensions of individual surface objects (peaks and troughs) have been determined including the factors affecting the formation of relief pattern. Certain parts of the profile and surface have been investigated for the presence of fractal structures. It was found that the system of clusters on the surface of the investigated sample is fractal. In addition, for each cluster dependence of the natural logarithm of the number of particles on the natural logarithm of the particle size of the cluster is approximately linear, that allows to consider the structure of individual clusters and the surface profile as fractal. The investigation of the current-voltage characteristics of the metal-metal silver sample with tungsten tip proves the experimental results demonstrating the need for careful analysis of the parameters affecting the tunneling current to receive extract information about the electronic structure of the sample.

Keywords: scanning tunneling microscopy, silver, mica, fractal dimension, profile, surface, currentvoltage characteristic, the thermal expansion of the tip

  • A.S. Antonov
  • O.V. Mikhailova (Zonova)
  • N.Yu. Sdobnyakov
  • D.N. Sokolov
  • D.V. Ivanov

Reference:

Antonov, A.S. SCANNING TUNNELING MICROSCOPY FOR THE NANOCOATING «SILVER/MICA»: RELIEF MORPHOLOGY AND ELECTRICAL CHARACTERISTICS / A.S. Antonov, O.V. Mikhailova (Zonova), N.Yu. Sdobnyakov, D.N. Sokolov, D.V. Ivanov // Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials. — 2015. — I. 7. — P. 31-46. DOI: 10.26456/pcascnn/2015.7.031. (In Russian).

Full article (in Russian): download PDF file

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