Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials. Founded at 2009

INVESTIGATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED ACETONE FILM BY ELLIPSOMETRIC METHOD

N.Yu.. Sdobnyakov, N.V. Novozhilov, A.S. Antonov, E.A. Voronova, O.V. Mikhailova

DOI: 10.26456/pcascnn/2014.6.349

Original article

Abstract: On the basis of analyzing the spectrum of the ellipsometric angles ψ and ∆ the investigation of thickness dependence of refractive index for nanosized acetone films on silicon surface using the photometric spectroellipsometer was carried out.

Keywords: photometric spectroellipsometer, nanosized acetone films, refractive index, thickness dependence

  • N.Yu.. Sdobnyakov
  • N.V. Novozhilov
  • A.S. Antonov
  • E.A. Voronova
  • O.V. Mikhailova

Reference:

Sdobnyakov N.Yu.., Novozhilov N.V., Antonov A.S., Voronova E.A., Mikhailova O.V. Issledovanie ellipsometricheskim metodom zavisimosti pokazatelya prelomleniya ot tolshchiny nanorazmernoj plenki atsetona [INVESTIGATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED ACETONE FILM BY ELLIPSOMETRIC METHOD], Fiziko-khimicheskie aspekty izucheniya klasterov, nanostruktur i nanomaterialov [Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials], 2014, issue 6, pp. 349-352. DOI: 10.26456/pcascnn/2014.6.349. ⎘

Full article (in Russian): download PDF file

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