Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials. Founded at 2009

ON THE TECHNIQUE OF PREPARING SAMPLES TO STUDY FRACTAL DIMENSION AND ELECTRICAL PROPERTIES OF SAMPLES USING A SCANNING TUNNELING MICROSCOPE

A.S. Antonov, O.V. Mikhailova, E.A. Voronova, N.Yu.. Sdobnyakov

DOI: 10.26456/pcascnn/2014.6.015

Original article

Abstract: In this paper the technique of preparation of samples for the study of fractal dimension and obtaining the current-voltage characteristics using a scanning tunneling microscope has been demonstrated.

Keywords: sample preparation, scanning tunneling microscopy (STM), fractal dimension, current- voltage characteristics

  • A.S. Antonov
  • O.V. Mikhailova
  • E.A. Voronova
  • N.Yu.. Sdobnyakov

Reference:

Antonov A.S., Mikhailova O.V., Voronova E.A., Sdobnyakov N.Yu.. O metodike podgotovki obraztsov dlya izucheniya fraktalnoj razmernosti i elektricheskikh svojstv obraztsov s pomoshchyu skaniruyushchego tunnelnogo mikroskopa [ON THE TECHNIQUE OF PREPARING SAMPLES TO STUDY FRACTAL DIMENSION AND ELECTRICAL PROPERTIES OF SAMPLES USING A SCANNING TUNNELING MICROSCOPE], Fiziko-khimicheskie aspekty izucheniya klasterov, nanostruktur i nanomaterialov [Physical and chemical aspects of the study of clusters, nanostructures and nanomaterials], 2014, issue 6, pp. 15-21. DOI: 10.26456/pcascnn/2014.6.015. ⎘

Full article (in Russian): download PDF file

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